NIST Traceable Reflected Light Stage Micrometer 1mm/100 Divisions
For use with reflected light microscopes 1mm in 100 divisions (0.01mm per division) numbered 0.0 thru 1.0.
Includes 10 points of calibration. I.E. - if you had a 1mm scale with sub-divisions every 0.1mm, therefore every division line will be calibrated, that would consist of 10 calibration points (0 to .1mm, 0 to .2mm, 0 to .3mm etc.). Any point thereafter is an additional cost. These reticles are made, and calibrated to order and generally take 2-3 weeks before shipping.
| Lines: | Chrome Deposition |
| Centering: | Within 0.0005" |
| Chamfer: | 0.010" - 0.020" |
| Flatness: | 2 waves or better |
| Glass: | 1" x 3" |
| Glass Thickness: | .110" |
| Surface Quality: | 20/10 |
| Parallelism: | 2 min. |
| Overall Pattern Tolerance: | +/- 0.0002"/0.005mm |
Original: $675.00
-70%$675.00
$202.50
Description
For use with reflected light microscopes 1mm in 100 divisions (0.01mm per division) numbered 0.0 thru 1.0.
Includes 10 points of calibration. I.E. - if you had a 1mm scale with sub-divisions every 0.1mm, therefore every division line will be calibrated, that would consist of 10 calibration points (0 to .1mm, 0 to .2mm, 0 to .3mm etc.). Any point thereafter is an additional cost. These reticles are made, and calibrated to order and generally take 2-3 weeks before shipping.
| Lines: | Chrome Deposition |
| Centering: | Within 0.0005" |
| Chamfer: | 0.010" - 0.020" |
| Flatness: | 2 waves or better |
| Glass: | 1" x 3" |
| Glass Thickness: | .110" |
| Surface Quality: | 20/10 |
| Parallelism: | 2 min. |
| Overall Pattern Tolerance: | +/- 0.0002"/0.005mm |
